The atom probe explores materials at atomic resolution in three dimensions by combining field-ion microscopy with time-of-flight mass spectrometry. Sharply-pointed specimens are subjected to cryogenic temperature and high voltage. This causes atoms at the apex of the specimen tip to ionize and accelerate towards a detector that records the ion's chemical identity and original location on the tip. APT literature includes:

• Sample preparation
  • Electropolishing
  • Focused Ion Beam
• Instrumentation and run parameters
• Data reconstruction and analysis methods and software

Please also refer to the atom probe refrence database.