Material science, Structural characterization, epitaxial layers, nanostructures

Techniques: X-ray scattering (lab setup&sychrotron), high resolution, diffuse scattering, anomalous scattering, small and wide angles...

Recent studies: Quantum dots&quantum dashes, defects in III-V/Silicon

Disciplines

• Education

Affiliation

FOTON INSA, France

Website

http://www.insa-rennes.fr/foton/